Key Features
- High precision flatness measurement of ground, lapped and semi-polished samples
- 3 dimensional imaging & analysis capacity
- Measure 2µm per fringe with excellent clarity
- Measure surfaces with roughness from 1nm to 300nm Ra
Description
The GI30 is a grazing incidence interferometer that provides high precision flatness measurement suitable for use with lapped and semi-polished surfaces up to 150mm (6")ø.
Unlike conventional fizeau interferometers, the GI30 can be used for measuring non-reflective surfaces, making them ideal for carrying out checks on lapped and/or ground surfaces prior to final polishing.
Each GI30 is fitted with an internal camera to provide the specially designed software with the images necessary to build a three dimensional map of the sample surface. As a grazing incidence interferometer, the GI30 is capable of measuring the flatness of lapped or semi-polished surfaces. This 3D imaging is particularly useful in a wide number of applications where lapped or semi-polished surfaces require to be checked mid-process for quality control purposes.
The Logitech designed software used in the GI30 also features analytical analysis for interpreting data through analysis tools such as statistics, aberrations, diffraction analysis, image processing and fiducial based geometric image transformations. This diversity is particularly useful when processing noisy data.
Applications
Applications for flatness measurement systems are virtually limitless. Whether the requirement is for flatness measurement or quality assessment, Logitech grazing incidence interferometers provide an excellent solution when processing :
- Semiconductor wafers
- Optical components
- Machined components
- Geological samples
The GI30 is particularly useful where a level of automation is required to help speed up the quality assessment process.
Product Options
The GI30 is available in either 240V, 50-60Hz or 110V,50-60Hz and is available with the following additional accessories:
- Test Flat
- Video Capture Unit
Product Specification
| Power Supply : | 240V, 50/60Hz 110V, 50/60Hz |
| Max Sample Size : | 150mm (6")ø |
| Surface Roughness : | 1nm to 300nm Ra |
| Fringe Spacing : | 2µm |
| Height : | 260mm |
| Depth : | 602mm |
| Width : | 430mm |
| Net Weight : | 24Kg |
For more information on the GI30 Flantess Measurement System, call us on +44 (0)1389 875444 or complete our contact form.