对加工完的工件进行检查和装配前的准备工作非常关键，Logitech的光学检验和测量设备正是为此目的设计。
Logitech的检验和测量设备应用的范围包括：
- 厚度测量
- 平整度测量
- 角度测量
CG-10 Gauge
The Logitech CG-10 Precision Electronic Measurement Systems is a compact gauging instrument suitable for most linear dimensional measurement applications.
GI-20 Flatness Measurement Gauge
The ability to measure the surface flatness of ground, lapped or semi-polished surfaces is a major benefit of the GI20 Unit.
LI-15 Fizeau Interferometer
The LI15 is ideal for checking optical flats and for carrying out flatness measurements on a wide range of optical components. It can also be used for measuring the flatness of polished semiconductor materials, where flatness is essential for subsequent processing.
NCG-2 Non-Contact Thickness Measurement Gauge
The NCG-2 is ideal for production and research environments in semiconductor, optics and electro-optics application areas, where the requirement is to measure precisely polished or fragile materials.
LG-1 Autocollimator
Autocollimators are used in laboratories to measure angles, typically small angular variations between two near-parallel surfaces. In polishing, the LG1 is typically used to adjust the orientation of a wafer or plate so that the front face is lapped and polished parallel to a reference face.
LI-10 Fizeau Interferometer
The LI10 is ideal for checking optical flats and for carrying out flatness measurements on a wide range of optical components. It can also be used for measuring the flatness of polished semiconductor materials, where flatness is essential for subsequent processing.
GI30 Flatness Measurement System
The GI30 is a grazing incidence interferometer that provides high precision flatness measurement suitable for use with lapped and semi-polished surfaces up to 150mm (6")ø.
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